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NUP1301ML3T1G, SZNUP1301ML3T1G
ESD Input Signal
Figure 1. ESD Test Circuit
APPLICATION NOTE
Electrostatic Discharge
A common means of protecting high ? speed data lines is
to employ low ? capacitance diode arrays in a rail ? to ? rail
configuration. Two devices per line are connected between
two fixed voltage references such as V CC and ground. When
the transient voltage exceeds the forward voltage (V F ) drop
of the diode plus the reference voltage, the diodes direct the
surge to the supply rail or ground. This method has several
advantages including low loading capacitance, fast response
time, and inherent bidirectionality (within the reference
voltages). See Figure 1 for the test circuit used to verify the
ESD rating for this device.
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